October 1, 2015 at 7:15 pm

INPP Seminar | Nuclear Physics Informing Science Policy: Ion Beam Analysis for Screening Consumer Products, Oct. 20

Graham Peaslee

Graham Peaslee

The Institute of Nuclear and Particle Physics (INPP) presents Graham F. Peaslee, of Hope College, Michigan, presenting Nuclear Physics Informing Science Policy:  Ion Beam Analysis for Screening Consumer Products,” on Tuesday, Oct. 20, at at 4 p.m. in Edwards Accelerator Lab, Roger W. Finlay Conference Room.

Abstract: Various ion beam analysis techniques have been used with small accelerators for decades, especially Particle Induced X-ray Emission (PIXE) and Rutherford Backscattering (RBS). These non-destructive analysis techniques allow elemental analysis and layer thickness and composition on the surface of almost any solid target.

We have been expanding the repertoire of samples studied by these techniques (and other ion beam analysis techniques such as Particle Induced Gamma-ray Emission (PIGE) to include environmental samples such as lake sediment, forensic samples such as glass and automotive paint, and most recently environmental toxins in consumer products.

This work includes the screening of polyurethane foams, textiles and plastics for halogenated flame retardant chemicals, consumer products for the presence of peri- and polyfluorinated compounds, and aerosols that contribute to air pollution. A summary of recent results will be presented together with future directions in which ion beam analysis is likely to go.

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